Trapping Behaviors in CNTFETs: Measurement and Analysis of Time Constant, Energy Level, and Trap Location Based on Transient Drain Current
Year: 2025
Type: article
Authors: Shijie Pan, Hui Zhu, Shiwei Feng, Yang Yang, Chao Xu, Shuai Huo, Xiaozhuang Lu, Yamin Zhang, Kun Bai
Institution: Beijing University of Technology
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Awards: G2681838757, G6256051334, G7763940209
OpenAlex ID: W4408793595