Image Tampering Detection
Year: 2025
Type: conference-paper
Authors: Sandeep Shinde, Apurv Waghmare, Anushka Varpe, Durva Ajgaonkar, Arya Alurkar
Institution: Vishwakarma Institute of Technology
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408794177