Work

Improving Threat Detection in Airport Security Inspections with X-ray Image Enhancement

Year: 2025

Type: conference-paper

DOI: 10.1109/icccit62592.2025.10928163

Authors: C. Siva Kumar, L. Vyshnavi, T. Charitha, V. Pavan Teja Reddy, V. Nikhil Reddy, B. Charan Sai Reddy

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Good health and well-being

Open Access status: closed

OpenAlex ID: W4408794252

FWCI: 0.781

Cites: 11

Cited by: 1

Related to: 10