Detailed Characterization of Isolated Single and Half-Bridge Gate Drivers from Room Temperature to Cryogenic Temperatures
Year: 2025
Type: article
Abstract: This study provides a comprehensive characterization of various isolated single and half-bridge gate drivers over the entire temperature range from room temperature down to -194 °C. Unlike previous studies, which primarily focused on electrical output parameters such as rise/fall times and propagation delays, this paper also explores critical functionalities like undervoltage lockout (UVLO) and common-mode transient immunity (CMTI). In general, most drivers demonstrate a trend toward reduced rise/fall times and propagation delays as temperatures decreased. The UVLO threshold of most gate drivers tested was found to be quite stable down to low temperatures, but with exceptions. The first comprehensive characterization of the power-up and -down behavior of gate drivers identified critical operating states for practical use. In addition, CMTI testing revealed premature functional failures of some drivers at low temperatures.
Source: Electronics
Institution: Friedrich-Alexander-Universität Erlangen-Nürnberg
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,896
OpenAlex ID: W4408825819