Work

Dynamic ferroelectric hysteresis scaling of four-layered Aurivillius phase CaBi4Ti4O15 thin films

Year: 2025

Type: article

Abstract: The hysteresis loop area represents the energy dissipation within one complete period of domain reversal, and it has been demonstrated that the scaling relation between ⟨A⟩ with electric field E and frequency f follows the power law in most systems as ⟨A⟩∝faEb. The evolution of dynamic hysteresis loops with electric field and frequency in ferroelectric CaBi4Ti4O15 thin films has been systematically investigated. At low electric fields, the scaling relation for the hysteresis loops of the thin films is ⟨A⟩∝f−0.0985E2.6939, while at high electric fields, the scaling relation is ⟨A⟩∝f−0.0985E2.0061. Both cases differ significantly from that of the theoretical prediction and also of the other lower l Aurivillius phase thin films. This indicates that the scaling relation is layer-structure and composition dependent. A relatively small value of index a is obtained in comparison with other ferroelectric materials, which imply that the thin films are less frequency-dependent and show more stable ferroelectric domain inversion than the others. All results demonstrate that the thin films possess excellent frequency stability and hysteresis is more dependent on the electric field rather than the frequency.

Source: Journal of Applied Physics

DOI: 10.1063/5.0245845

Authors: Y. Lei, D. P. Song, Y. Zhang, R. Z. Li, L. Guo, J. Yang

Institution: Jiangsu University of Science and Technology

Language: English

Topic: Ferroelectric and Piezoelectric Materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $3,500

Funder: National Natural Science Foundation of China