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Molecular simulation calculation and kinetic degradation model for thermal aging of transformer insulation paper

Year: 2024

Type: conference-paper

Source: International Conference on Electrical Engineering and Control Science (IC2ECS)

DOI: 10.1109/ic2ecs64405.2024.10928572

Authors: Ran Zhuo, Ying Wu, Zhiming Huang, Wenlong Xu, Sicheng Zhao, Qiulin Chen

Institutions: China Southern Power Grid (China), Chongqing University

Language: English

Topic: Power Transformer Diagnostics and Insulation

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408839490

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