Work

Equivalent Circuit Model for Simulating ESD Discharge Current in ESD Damage Test

Year: 2025

Type: article

Source: IEICE Transactions on Communications

DOI: 10.23919/transcom.2024mcp0009

Authors: Yusuke Yano, Shoma Ishihara, Hironori Ito, Jianqing Wang

Institution: Nagoya Institute of Technology

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408840502

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Cites: 17

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Related to: 10