Optimized single‐beam modulation argon ion milling for TEM cross‐sectional specimens of nanostructured interfaces
Year: 2025
Type: article
Source: Journal of Microscopy
DOI: 10.1111/jmi.13406
Authors: Xiangtao Luo, Sujuan Ding, Haozhe Lu, Chuanhong Jin
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G1132090337, G8754574993
OpenAlex ID: W4408846063
