Chrono: Meticulous Hotness Measurement and Flexible Page Migration for Memory Tiering
Year: 2025
Type: conference-paper
Authors: Zhenlin Qi, Shengan Zheng, Ying Huang, Yifeng Hui, Bowen Zhang, Linpeng Huang, Hong Mei
Institutions: Shanghai Jiao Tong University, Intel (United States)
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Funder: Universitas Brawijaya
Awards: G459024132, G5806234848, G7905062814
OpenAlex ID: W4408846857
