Snapshot angle-resolved channeled spectroscopic micro-ellipsometry for thin-film characterization
Year: 2025
Type: article
Source: Applied Optics
DOI: 10.1364/ao.558576
Authors: Young Joon Kim, Se Jun Lee, Heui Jae Pahk
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408848093