Work

IAMF-YOLO: Metal Surface Defect Detection Based on Improved YOLOv8

Year: 2025

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2025.3548198

Authors: Chang Chao, Xingyu Mu, Zihan Guo, Yujie Sun, Xincheng Tian, Fang Yong

Institutions: Shandong University, Shandong Museum

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Natural Science Foundation of Shandong Province, Taishan Scholar Project of Shandong Province, National Key Research and Development Program of China

Awards: G3871505980, G4447573905

OpenAlex ID: W4408852291

FWCI: 21.74

Cites: 52

Cited by: 43

Related to: 10