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System for Detecting Warpage Deformation in Printed Circuit Boards Based on Digital Image Correlation

Year: 2024

Type: conference-paper

Source: International Conference on Electrical Engineering and Control Science (IC2ECS)

DOI: 10.1109/ic2ecs64405.2024.10928691

Authors: Xingyao Li, Ying Zhou, Peiyan Mao

Institution: Shanghai Maritime University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408856340

FWCI:

Cites: 16

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Related to: 10