Work

Design of Strip Surface Defect Detection System Based on Machine Vision

Year: 2024

Type: conference-paper

Source: International Conference on Electronic Information Engineering and Computer Communication (EIECC)

DOI: 10.1109/eiecc64539.2024.10929540

Authors: Xiaolong Liu, Xinghua Wang, Runxin Meng

Institution: Shanghai Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408857046

FWCI: 0.755

Cites: 5

Cited by: 1

Related to: 10