Work

A low-power, high-efficiency charge pump circuit for the coexistence of multiple charge pumps in 55 nm CMOS

Year: 2024

Type: conference-paper

Source: International Conference on Electronic Information Engineering and Computer Communication (EIECC)

DOI: 10.1109/eiecc64539.2024.10929122

Author: Yu Liu

Institution: Tianjin University of Technology

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408857481

FWCI:

Cites: 10

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Related to: 10