Single Event Effect on SiC MOSFETs With Junction Barrier Schottky Diode Structures
Year: 2025
Type: article
Authors: Xinyu Li, Feng He, Xiping Niu, Xintian Zhou, Ling Sang, Yawei He, Yunpeng Jia, Rui Jin
Institution: Beijing University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408858626