Work

Heavy Ion-Induced Permanent Damage in Cascode Power GaN HEMTs

Year: 2025

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2025.3554792

Authors: Chao Peng, Jianqun Yang, Zhifeng Lei, Xiuhai Cui, Teng Ma, Zhangang Zhang, Yujuan He, Yiqiang Chen, Guoguang Lu, Xianghong Hu

Institutions: China Electronic Product Reliability and Environmental Test Institute, Harbin Institute of Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G2014358573, G3862816961, G4102538767, G703656410

OpenAlex ID: W4408858637

FWCI: 0.227

Cites: 30

Cited by: 1

Related to: 10