Work

Impact of the Endurance Measurement Methodology on Ferroelectric Field Effect Transistor Under the Capacitive Nondestructive Read

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3552545

Authors: Omkar Phadke, Prasanna Venkatesan Ravindran, Halid Mulaosmanovic, Stefan Dünkel, Sven Beyer, Asif Khan, Suman Datta, Shimeng Yu

Institutions: Georgia Institute of Technology, GlobalFoundries (Germany)

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408860636

FWCI: 0.676

Cites: 22

Cited by: 3

Related to: 10