Work

Feasibility of Nano Electrical Resistive Tomography for Subsurface Atomic Force Microscopy

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Mechatronics (ICM)

DOI: 10.1109/icm62621.2025.10934851

Authors: Benjamin J. Stanwell, Yuen Kuan Yong, Andrew J. Fleming

Institution: University of Newcastle Australia

Language: English

Topic: Electrical and Bioimpedance Tomography

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Australian Research Council

Award: Subsurface Atomic Force Microscopy using Dual Probes

OpenAlex ID: W4408862148

FWCI:

Cites: 27

Cited by:

Related to: 10