Work

YOLO-DHC:A Multi-scale method for PCB defect detection

Year: 2024

Type: conference-paper

Source: International Symposium on Artificial Intelligence and Intelligent Manufacturing (AIIM)

DOI: 10.1109/aiim64537.2024.10934579

Authors: Ying Li, Wei Yang

Institution: Xihua University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408862161

FWCI: 3.615

Cites: 6

Cited by: 5

Related to: 10