Work

Enhanced Coffee Bean Defect Detection Using Super-Resolution GANs and Deep Learning

Year: 2025

Type: conference-paper

Source: International Conference on Computational Intelligence, Communication Technology and Networking (CICTN)

DOI: 10.1109/cictn64563.2025.10932332

Authors: S. Prabu, P.S. Thanigaivelu, S. Poonkodi, M. Anand

Institution: SRM Institute of Science and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Zero hunger

Open Access status: closed

OpenAlex ID: W4408863135

FWCI: 2.423

Cites: 15

Cited by: 1

Related to: 10