Work

Chemical Mapping of Supramolecular Self-Assembled Monolayers via Atomic Force Microscopy-Based Infrared with a Nanometer-Scale Lateral Resolution

Year: 2025
Type: article
Abstract: Atomic force microscopy-based infrared (AFM-IR) techniques have long enabled chemical imaging of surfaces with spatial resolutions down to 10 nm. In this study, we push the boundaries of AFM-IR spatial resolution to the single-nanometer scale, achieving chemical mapping of supramolecular networks at the submolecular level. This breakthrough is made possible by implementing an innovative tapping-mode AFM-IR approach. Such unprecedented resolution opens new horizons for advancements in nanoscience.
Language: English
Open Access status: green
OpenAlex ID: W4408897673
FWCI: 3.467
Cites: 22
Cited by: 9
Related to: 10