Enhancing the Carrier Transport in Dielectric Passivation Layers via the Introduction of Trap States toward Improved CH3NH3PbI3/Si Heterojunction Photodetectors
Year: 2025
Type: article
Authors: Pengyu Chen, Jianxiang Huang, Guipeng Li, Hongping Li, Huimin Zhang, Chenglin Zhang, Yuan Liu, Dawei Cao, Mingming Chen
Institution: Jiangsu University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408925039
