Work

The Electrical Characterization of TeO2-based Metal-Oxide-Semiconductor Devices

Year: 2025

Type: article

Source: ECS Journal of Solid State Science and Technology

DOI: 10.1149/2162-8777/adc6ba

Authors: Ebru Dönmez, Osman Pakma, Şadan Özden, Nejmettin Avcı, Pınar Özden, İshak. Afşin Kariper

Institutions: Batman University, Muğla University, Erciyes University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408932534

FWCI: 0.462

Cites: 47

Cited by: 2

Related to: 10