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Anomaly Detection and Control in Supply Chains Based on Image Feature Modeling

Year: 2025

Type: article

Source: International Journal of Pattern Recognition and Artificial Intelligence

DOI: 10.1142/s0218001425540060

Author: Yue Pan

Institution: Nanjing University of Information Science and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408946570

FWCI:

Cites: 26

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Related to: 10