Work

Buried Interfacial Engineering with Potassium Hypophosphite to Suppress Ion Migration for Improved and Stabilized Perovskite Photodetectors

Year: 2025

Type: article

Source: ACS Applied Electronic Materials

DOI: 10.1021/acsaelm.5c00200

Authors: Jianxiang Huang, Huimin Zhang, Huiying Zhu, Chenglin Zhang, Mingming Chen, Dawei Cao

Institution: Jiangsu University

Language: English

Topic: Perovskite Materials and Applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: China Postdoctoral Science Foundation

Award: G4192956769

OpenAlex ID: W4408973507

FWCI: 0.231

Cites: 65

Cited by: 1

Related to: 10