Work

Application of Cumulative Exposure Model for the Step-Up Voltage Tests of MOSFET Devices

Year: 2024

Type: conference-paper

Source: International Conference on System Reliability and Safety (ICSRS)

DOI: 10.1109/icsrs63046.2024.10927502

Authors: Roman Mukin, Elena Mengotti, Enea Bianda, Kai Hencken

Institution: ABB (Switzerland)

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409013538

FWCI:

Cites: 10

Cited by:

Related to: 10