Work

Stress Sensitivity Analysis of Grating Encoders Based on Accelerated Degradation Test

Year: 2024

Type: conference-paper

Source: International Conference on System Reliability and Safety (ICSRS)

DOI: 10.1109/icsrs63046.2024.10927600

Authors: Axita, Zhaojun Yang, Jinyan Guo, Chuanhai Chen, Zhifeng Liu, Shang Yang

Institution: Jilin University

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Natural Science Foundation of Jilin Province, National Natural Science Foundation of China, Natural Science Foundation of Chongqing, Fundamental Research Funds for the Central Universities

Awards: G6326235328, G7516402448, G7904191804

OpenAlex ID: W4409013648

FWCI:

Cites: 12

Cited by:

Related to: 10