Work

Common Cause Failure Assessment Suitable for a System on a Chip Design According to ISO 13849 Standard

Year: 2024

Type: conference-paper

Source: International Conference on System Reliability and Safety (ICSRS)

DOI: 10.1109/icsrs63046.2024.10927484

Authors: Elisa Spano', Alessandro Campinoti, Laura Spinella

Institution: Intel (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409013669

FWCI:

Cites: 6

Cited by:

Related to: 10