Work

Advanced Waste Detection Leveraging YOLO for High-Precision Classification

Year: 2025

Type: conference-paper

DOI: 10.1109/iccece61355.2025.10941087

Authors: Ripan Roy, Tauquir Ahmed, Abhishek Majumdar

Institution: Techno India University

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

SDG: Responsible consumption and production

Open Access status: closed

OpenAlex ID: W4409019552

FWCI: 0.785

Cites: 7

Cited by: 1

Related to: 10