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Enhancing Ultrasonic Thin Film Measurement Using PCA and DFT Driven Machine Learning Models

Year: 2024

Type: conference-paper

Source: IEEE MIT Undergraduate Research Technology Conference (URTC)

DOI: 10.1109/urtc65039.2024.10937577

Author: Jollen Dai

Language: English

Topic: Ultrasonics and Acoustic Wave Propagation

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409020000

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Cites: 4

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Related to: 10