Work

Electromigration Failure Characterization Using Laser-Induced Nonuniform Heating

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3549743

Authors: Srijita Patra, Bahar Ajdari, Ricardo Ascazubi, Ratnesh Kumar

Institutions: Intel (United States), Iowa State University

Language: English

Topic: Copper Interconnects and Reliability

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

Awards: NSF-MeitY: Fundamental Realizable Limit Vibration Energy Harvesting: Design, Analysis, and Implementation, Elements: Agricultural Cyber-infrastructure support for Field and Grid Modeling, and Runtime Decision-Making, PFI-TT: A Fiber-Optic Sensing System for Multiplexed Gas Detection

OpenAlex ID: W4409020115

FWCI:

Cites: 10

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Related to: 10