AI-Driven Semiconductor Manufacturing via IC Failure Prediction: Cost-Effective Strategies for Process Improvement
Year: 2024
Type: conference-paper
Authors: P. Shailaja, K. Kranthi Kumar, K. Sirnivas, V. Bharath Simha Reddy, Kesana Mohana Lakshmi, D. Rajani
Institutions: Vaagdevi College of Engineering, CMR University
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409047258