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Deep Learning in Semiconductor Devices for Road Damage Inspection Applications

Year: 2024

Type: conference-paper

DOI: 10.1109/icdscnc62492.2024.10939564

Author: Vijay Kumar Kodavalla

Institution: Wipro (India)

Language: English

Topic: Infrastructure Maintenance and Monitoring

Subfield: Civil and Structural Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409047483

FWCI:

Cites: 8

Cited by:

Related to: 10