A Hybrid DCNN ECOC-SVM System for Detecting Semiconductor Wafer Defects Using Histogram Equalization
Year: 2024
Type: conference-paper
Authors: Sharith Dhar, Md. Saiful Islam
Institution: Chittagong University of Engineering & Technology
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409060832