Work

Robust PCB Anomaly Detection Using Aligned Design Information

Year: 2025

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2025.3554823

Authors: Kunting Luo, Yanxia Liu, Zihe Yu

Institution: South China University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, South China University of Technology, Fundamental Research Funds for the Central Universities, Basic and Applied Basic Research Foundation of Guangdong Province

Awards: G1877776472, G2609691049, G2857592650, G8887390484

OpenAlex ID: W4409076613

FWCI: 1.005

Cites: 33

Cited by: 2

Related to: 10