Work

Anomaly Detection in Industrial Quality Control with Computer Vision and Deep Learning

Year: 2024

Type: conference-paper

DOI: 10.1109/icdscnc62492.2024.10939633

Authors: A. Jenita Mary, V. Umesh, Prerana Nilesh Khairnar, R Sahana, Sangeethaa SN, Shanthi H J

Institutions: SRM Institute of Science and Technology, Karnataka State Open University, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Bannari Amman Institute of Technology, Hindustan Institute of Technology and Science

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409077733

FWCI:

Cites: 21

Cited by:

Related to: 10