Work

Enhanced Detection and Classification of PCB Defects Utilizing Advanced YOLO Architectures

Year: 2024

Type: conference-paper

DOI: 10.1109/teeccon64024.2024.10941138

Authors: Vidhun Roshan, Viksith Bardia, M Prabu

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409077763

FWCI:

Cites: 21

Cited by:

Related to: 10