Work

Research on Defect Detection Method for PCB Components Based on Improved YOLOv8

Year: 2024

Type: conference-paper

Source: International Conference on Advanced Sensing, Intelligent Manufacturing (ASIM)

DOI: 10.1109/asim66270.2024.00022

Authors: Bin Zhou, Yuxi Shi, Tong Xu, Hongda Luo

Institution: Wuhan University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409102878

FWCI:

Cites: 11

Cited by:

Related to: 10