Work

Research on Digital Instrument Detection Model Based on Machine Vision

Year: 2024

Type: conference-paper

Source: International Conference on Computer and Communications (ICCC)

DOI: 10.1109/iccc62609.2024.10941875

Authors: Bengang Liu, Wenjiang Wu, Yushu Zhang, Tao Ren

Institutions: Chinese Academy of Sciences, Shenyang Institute of Computing Technology (China), University of Chinese Academy of Sciences, Northeastern University

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409103036

FWCI:

Cites: 7

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Related to: 10