An Analytical Model of Dynamic Charge Transfer Process for CMOS Image Sensors
Year: 2025
Type: article
Source: IEEE Sensors Journal
Authors: Jing Gao, Chen Chen, Jinghua Ao, Tao Luo, Hong Yin
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G2979307054, G8811710927
OpenAlex ID: W4409129112