Work

Analysis of Resistance Increase in Silicone Rubber Socket using CT Analysis Method

Year: 2025

Type: article

Source: Journal of the Institute of Electronics and Information Engineers

DOI: 10.5573/ieie.2025.62.2.111

Authors: Hyeonbin Baek, Moonjung Kim

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409132597

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