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Design and Fabrication of Accelerometer Based on Atomic Force Microscope Measurement Principle

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Year: 2025
Type: article
Source: IEEE Sensors Journal
DOI: 10.1109/jsen.2025.3555996
Authors: Bin Miao, Hongji Guo, Dingyi Wang, Wen Xiong, Changkun Feng, Zhan Xu, Siyuan Fang, Hanwenyu Zhan, Peng Yu, Jiadong Li
Institutions: University of Science and Technology of China, Shenyang Institute of Automation, Chinese Academy of Sciences, State Key Laboratory of Robotics, Huazhong University of Science and Technology, Suzhou Institute of Nano-tech and Nano-bionics
Language: English

Topic: Advanced MEMS and NEMS Technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China
Awards: G2831238497, G6234028110, G6957531135
OpenAlex ID: W4409153098
FWCI:
Cites: 27
Cited by:
Related to: 10
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