Remaining Useful Life Prediction for Nonlinear Degrading Equipment With Quantization Errors
Year: 2025
Type: article
Source: IEEE Sensors Journal
Authors: Qing Dong, Changhua Hu, Hong Pei, Jianxun Zhang, Jianfei Zheng, Dangbo Du
Institution: PLA Rocket Force University of Engineering
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409153165
