Work

Second Chance for End-of-Life Flash Memory Blocks via Page Isolation

Year: 2024

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/iirw62856.2024.10947161

Authors: M. Ceylan Morgul, Mircea Stan

Institution: University of Virginia

Language: English

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Semiconductor Research Corporation

OpenAlex ID: W4409156104

FWCI: 0.443

Cites: 13

Cited by: 1

Related to: 10