Work

A predictive method for the degradation of a charge storage memory on a dedicated 4kb test vehicle

Year: 2024

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/iirw62856.2024.10947141

Authors: Sebastien Perrin, Khaled Alkema, Vincenzo Della Marca, Thibault Kempf, Olivier Paulet, Martin Arteaga, Madjid Akbal, Brice Arrazat, Joël Metz, Jean-Michel Moragues, Arnaud Regnier, Marc Bocquet, Jean-Michel Portal

Institutions: STMicroelectronics (France), Centre National de la Recherche Scientifique, Aix-Marseille Université, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409156126

FWCI: 0.779

Cites: 3

Cited by: 1

Related to: 10