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A Device-to-Circuit Aging Framework to Study NBTI Process Dependence

Year: 2024

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/iirw62856.2024.10947152

Authors: Arnav Shaurya Bisht, Payel Chatterjee, Raj Sambhav, Souvik Mahapatra

Institution: Indian Institute of Technology Bombay

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409156311

FWCI: 4.836

Cites: 22

Cited by: 6

Related to: 10