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Activity Compatible Device-to-Circuit Framework for Process, BTI and HCD Variability

Year: 2024

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/iirw62856.2024.10947162

Authors: Jay Sonawane, Payel Chatterjee, Souvik Mahapatra

Institution: Indian Institute of Technology Bombay

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409156645

FWCI:

Cites: 17

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Related to: 10