Work

Detection of Proton Irradiation Damage in 4H-SiC Schottky Diodes via Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance

Year: 2024

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/iirw62856.2024.10947146

Authors: Dustin T. Hassenmayer, Edward S. Bielejec, Joshua M. Young, David J. Spry, Patrick M. Lenahan

Institutions: Pennsylvania State University, Sandia National Laboratories, Glenn Research Center

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Nuclear Security Administration, Air Force Office of Scientific Research

OpenAlex ID: W4409156657

FWCI:

Cites: 2

Cited by:

Related to: 10