Work

Investigation of Heterojunction Bipolar Transistor Reliability for Analog and RF Applications

Year: 2024

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/iirw62856.2024.10947136

Authors: F. Cacho, J. Hai, N. Revil, B. Van-Haaren, N. Quesseveur, V. Yon, P. Cathelin, J. Forest, V. Knopik, T. Lapergue, S. Bouvot, R. Debroucke, S. Jan

Institution: STMicroelectronics (France)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409156663

FWCI:

Cites: 10

Cited by:

Related to: 10