Overestimation of NBTI lifetimes measured on hot chuck for PMOS with antennas for PID assessment
Year: 2024
Type: conference-paper
Authors: Andreas Martin, Jonathan Kampmann, Fedja Jan Wendisch, Heiko Nielen
Institution: Infineon Technologies (Germany)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409156808